Focus-stacking PRECISION OPTICAL METROLOGY / 2D + 3D
Nano-Z High Precision 3D measurement system.
Nano-Z by Optike is an advanced non-contact optical measurement system designed for ultra-precise dimensional inspection in X, Y, and Z axes. Engineered for high accuracy and repeatability, Nano-Z delivers reliable measurement results for complex components, micro-features, and precision manufacturing applications.
Same capture, two outputs. The height map is built from the focus positions recorded during the scan — nothing is inferred from shading.
- Z-axis travel
- 40 mm
- magnification
- 30x-6000x
- Linear scale accuracy
- 1 µm
- Capture
- 3840 × 2160 8 MP
How a stack becomes a measurement
Four steps, one button. The operator sets the top and bottom of the scan; everything after that runs unattended.
Step through focus
The motorised Z-axis moves in increments as fine as 0.3 µm across 40 mm of travel, capturing a frame at each plane. A linear scale reads true position to 1 µm, so the stack is not relying on step counting.
Keep only what is sharp
Each pixel is scored for local sharpness across the stack and the sharpest wins. A tilted, stepped or rough part comes out fully in focus in a single frame.
Turn focus into height
The plane a pixel came from is its height. The stack becomes a surface model you can rotate, cross-section and profile, with the original colour mapped onto it.
Record the result
Distance, angle, radius and area in 2D; height, step and profile in 3D. Results export to Excel with the capture attached, so the number and the evidence stay together.
Built around the scan
Nothing on this instrument exists to look impressive on a bench. Each part is there because the stack depends on it.
Closed-loop Z drive
0.3 µm motor step with an independent 1 µm linear scale. Position is measured, not assumed, so stacks stay consistent between runs.
Three lighting paths
Coaxial for specular metal, ring for surface topography, transmitted for anything translucent. Switch between them without touching the sample.
Five objectives
2×, 5×, 10×, 20× and 50×, with a manual zoom body between the objective and the sensor for continuous framing.
4K CMOS sensor
1/1.8″ sensor capturing 3840 × 2160, with HDR bracketing for parts that mix bright metal and dark resin in one frame.
Reporting that leaves the room
Measurements export straight to Excel alongside the images, ready to attach to an inspection record.
Captures from the instrument
Unretouched frames, with the scale and field of view recorded at capture. Every figure below is read from the image metadata, not calculated from a magnification claim.
Plated contact array
Glass seal, transmitted light
Brass ferrule end face
Diamond knurl, tool marks
Areas of Applications
Anywhere a part is too tall, too tilted or too rough for a conventional microscope to hold in focus.
Areas of Applications
Nano-Z is designed for high-precision inspection of components and surfaces where conventional microscopes may struggle with height, tilt, roughness, or complex geometries.
PCB & Electronics Inspection
Inspect circuit boards, electronic components, solder joints and fine surface features with high-resolution imaging.
Medical Devices & Micro Components
Examine medical components and precision-finished surfaces for defects, scratches, burrs and surface quality.
Precision Machined Components
Inspect machined parts, edges, holes and complex geometries requiring accurate surface observation.
Automotive Parts
Analyze automotive components for wear, defects, machining quality and surface imperfections.
Micro-Feature Analysis
Observe small features and surface details to identify defects that are difficult to detect using conventional inspection.
Defect Detection
Identify cracks, scratches, contamination, burrs and other manufacturing defects with detailed imaging.
Fracture & Wear Analysis
Examine fractured surfaces, wear patterns and material conditions for detailed failure analysis.
Incoming Goods Inspection
Verify incoming components and materials for dimensional, cosmetic and surface-quality defects.
Research & Quality Control
Support laboratory research, product development and quality control with flexible non-contact inspection.
Specifications
Model Nano-Z. Figures apply to the standard configuration.
Camera
Specifications
Optical
Parameters
Objective Lens
Measurement
Functions
Camera
Features
Working
Environmetal
Delivered ready to run
- YS-800 microscope column with motorised Z axis and glass stage
- Fanless industrial controller, pre-installed and licensed
- Monitor, keyboard and mouse
- Objective set, calibration target and power supply
- Installation and operator training
Send us a part. We will scan it and send back the data.
The quickest way to know whether the YS-800 suits your inspection is to see your own sample measured on it. Sample evaluations are free.